homepage |
![]() |
|||||||||||
Scientists and students in the Center for Advanced Research and Technology (CART) at UNT now have the opportunity to think big by starting extremely small — looking at molecules and atoms. This new nanotechnology research at UNT started with two highly advanced electron microscopes that were unveiled March 22 at the UNT Research Park. One instrument is a dual-beam focused ion beam/scanning electron microscope, performing at the nanometer (one billionth of a meter) level. The other is an analytical high-resolution transmission electronic microscope, performing at the atomic level. Both instruments were manufactured by the FEI Co., which has entered into a formal partnership with UNT researchers. The microscopes were purchased with $3.1 million earmarked by the U.S. Congress in the 2004 Defense Appropriations bill. U.S. Rep. Michael Burgess, who rallied support for the UNT appropriation, has commended UNT for its foresight in investing in nanotechnology and for taking the first steps to serve as the North Texas region's research arm in this rapidly evolving new science. Sen. Kay Bailey Hutchison sponsored the measure in the U.S. Senate. Working on the 2005 Defense Appropriations bill, Burgess and Hutchison teamed up once again to place a $4.8 million authorization for UNT's CART. Using the microscopes separately and together (they are located in adjoining laboratories), UNT researchers aim to transform their academic research into actual products via a better understanding of the way materials behave at the level of the nanometer and the atom and the ability to manipulate these materials. According to UNT President Norval Pohl, the combined capabilities of these two instruments are unique in the southwestern United States and place UNT in an exclusive position both regionally and nationally.
The CART researchers say potential products that may result from this new capability for state-of-the-art materials characterization include:
Other featured articles in this issue
|
|
|||||||||||